Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds

E. Lamers; X.F. Walboomers; M. Domanski; G. McKerr; B.M. O'Hagan; C.A. Barnes; L. Peto; R. Luttge; A.J.A. Winnubst; J.G.E. Gardeniers; J.A. Jansen

doi:10.1089/ten.tec.2010.0251

Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds

E. Lamers
, X.F. Walboomers
, M. Domanski
, G. McKerr
, B.M. O'Hagan
, C.A. Barnes
, L. Peto
, R. Luttge
, A.J.A. Winnubst
, J.G.E. Gardeniers
, J.A. Jansen

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	1-7
Journal	Tissue Engineering. Part C: Methods
Volume	17
Issue number	1
DOIs	https://doi.org/10.1089/ten.tec.2010.0251
Publication status	Published - 2011

Access to Document

10.1089/ten.tec.2010.0251

Cite this

Lamers, E., Walboomers, X. F., Domanski, M., McKerr, G., O'Hagan, B. M., Barnes, C. A., Peto, L., Luttge, R., Winnubst, A. J. A., Gardeniers, J. G. E., & Jansen, J. A. (2011). Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds. Tissue Engineering. Part C: Methods, 17(1), 1-7. https://doi.org/10.1089/ten.tec.2010.0251

@article{73fa53f4fd65430c8bba9fa13a95624a,

title = "Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds",

author = "E. Lamers and X.F. Walboomers and M. Domanski and G. McKerr and B.M. O'Hagan and C.A. Barnes and L. Peto and R. Luttge and A.J.A. Winnubst and J.G.E. Gardeniers and J.A. Jansen",

year = "2011",

doi = "10.1089/ten.tec.2010.0251",

language = "English",

volume = "17",

pages = "1--7",

journal = "Tissue Engineering. Part C: Methods",

issn = "1937-3384",

publisher = "Mary Ann Liebert Inc.",

number = "1",

}

Lamers, E, Walboomers, XF, Domanski, M, McKerr, G, O'Hagan, BM, Barnes, CA, Peto, L, Luttge, R, Winnubst, AJA, Gardeniers, JGE & Jansen, JA 2011, 'Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds', Tissue Engineering. Part C: Methods, vol. 17, no. 1, pp. 1-7. https://doi.org/10.1089/ten.tec.2010.0251

TY - JOUR

T1 - Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds

AU - Lamers, E.

AU - Walboomers, X.F.

AU - Domanski, M.

AU - McKerr, G.

AU - O'Hagan, B.M.

AU - Barnes, C.A.

AU - Peto, L.

AU - Luttge, R.

AU - Winnubst, A.J.A.

AU - Gardeniers, J.G.E.

AU - Jansen, J.A.

PY - 2011

Y1 - 2011

U2 - 10.1089/ten.tec.2010.0251

DO - 10.1089/ten.tec.2010.0251

M3 - Article

SN - 1937-3384

VL - 17

SP - 1

EP - 7

JO - Tissue Engineering. Part C: Methods

JF - Tissue Engineering. Part C: Methods

IS - 1

ER -