Abstract
15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Original language | English |
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Pages (from-to) | 1733-1738 |
Journal | Microelectronics and Reliability : an International Journal and World Abstracting Service |
Volume | 44 |
Issue number | 9-11 |
DOIs | |
Publication status | Published - 2004 |