Abstract
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the customer. In this paper, we show that techniques and tools used in the testing field can also be (re-)used to create value to (1) designers, (2) manufacturers, and (3) customers alike. First, we show how the test infrastructure can be used to detect, diagnose, and correct design errors in prototype silicon. Secondly, we discuss how test results are used to improve the manufacturing process and hence production yield. Finally, we present test technologies that enable systems of high reliability for safety-critical applications.
Original language | English |
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Title of host publication | 2003 Design, Automation and Test in Europe Conference and Exhibition |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 402-407 |
ISBN (Print) | 0-7695-1870-2 |
DOIs | |
Publication status | Published - 2003 |
Externally published | Yes |
Event | 6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Germany Duration: 3 Mar 2003 → 7 Mar 2003 |
Conference
Conference | 6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) |
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Abbreviated title | DATE 2003 |
Country/Territory | Germany |
City | Munich |
Period | 3/03/03 → 7/03/03 |