Creating value through test

E.J. Marinissen, B. Vermeulen, R. Madge, M. Kessler, M. Muller

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

2 Citations (Scopus)

Abstract

Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the customer. In this paper, we show that techniques and tools used in the testing field can also be (re-)used to create value to (1) designers, (2) manufacturers, and (3) customers alike. First, we show how the test infrastructure can be used to detect, diagnose, and correct design errors in prototype silicon. Secondly, we discuss how test results are used to improve the manufacturing process and hence production yield. Finally, we present test technologies that enable systems of high reliability for safety-critical applications.
Original languageEnglish
Title of host publication2003 Design, Automation and Test in Europe Conference and Exhibition
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages402-407
ISBN (Print)0-7695-1870-2
DOIs
Publication statusPublished - 2003
Externally publishedYes
Event6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Germany
Duration: 7 Mar 20037 Mar 2003

Conference

Conference6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003)
CountryGermany
CityMunich
Period7/03/037/03/03

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