Creating value through test

E.J. Marinissen; B. Vermeulen; R. Madge; M. Kessler; M. Muller

doi:10.1109/DATE.2003.1253643

Creating value through test

E.J. Marinissen, B. Vermeulen, R. Madge, M. Kessler, M. Muller

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

2 Citations (Scopus)

Abstract

Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the customer. In this paper, we show that techniques and tools used in the testing field can also be (re-)used to create value to (1) designers, (2) manufacturers, and (3) customers alike. First, we show how the test infrastructure can be used to detect, diagnose, and correct design errors in prototype silicon. Secondly, we discuss how test results are used to improve the manufacturing process and hence production yield. Finally, we present test technologies that enable systems of high reliability for safety-critical applications.

Original language	English
Title of host publication	2003 Design, Automation and Test in Europe Conference and Exhibition
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	402-407
ISBN (Print)	0-7695-1870-2
DOIs	https://doi.org/10.1109/DATE.2003.1253643
Publication status	Published - 2003
Externally published	Yes
Event	6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Germany Duration: 7 Mar 2003 → 7 Mar 2003

Conference

Conference	6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003)
Country	Germany
City	Munich
Period	7/03/03 → 7/03/03

Access to Document

10.1109/DATE.2003.1253643

Cite this

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title = "Creating value through test",

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Marinissen, EJ, Vermeulen, B, Madge, R, Kessler, M & Muller, M 2003, Creating value through test. in 2003 Design, Automation and Test in Europe Conference and Exhibition . Institute of Electrical and Electronics Engineers, Piscataway, pp. 402-407, 6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003), Munich, Germany, 7/03/03. https://doi.org/10.1109/DATE.2003.1253643

TY - CHAP

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AU - Vermeulen, B.

AU - Madge, R.

AU - Kessler, M.

AU - Muller, M.

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Y1 - 2003

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