Co/X multilayers, NMR study of microscopic structure and strain

H.A.M. de Gronckel, J.A.M. Bienert, F.J.A. Broeder, den, W.J.M. Jonge, de

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9 Citations (Scopus)

Abstract

Co/X multilayers (X = Ir, Au, Cu, Pd) were investigated by NMR. All multilayers contained mainly fcc Co. A significant number of stacking faults is present giving a positive contribution to the magnetic volume anisotropy. In Co/Cu a linear dependence of the strain on the inverse Co thickness was observed. This might give rise to an apparent interface anisotropy. Signals due to interface atoms in Co/Cu indicate an atomic roughness of theinterfaces of about one atomic distance.
Original languageEnglish
Pages (from-to)457-461
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume93
DOIs
Publication statusPublished - 1991

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