Coupling event domain and time domain models for manufacturing systems

J.A.W.M. Eekelen, van; A.A.J. Lefeber; J.E. Rooda

doi:10.1109/CDC.2006.377701

Coupling event domain and time domain models for manufacturing systems

J.A.W.M. Eekelen, van, A.A.J. Lefeber, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

76 Downloads (Pure)

Abstract

Manufacturing systems are often characterizedas discrete event systems (DES) and consequently, these systemsare modeled with discrete event models. For certaindiscrete event modeling paradigms, control theory/techniqueshave been developed in event domain. However, from a controlor performance perspective, a lot of notions are time related,like stability, settling time, transient behavior, throughput,flow time, efficiency, etc. Moreover, if we also consider market/customer requirements, almost all requirements are withintime perspective: due dates, deliverability, earliness, tardiness,etc. Therefore, it is also useful to have time driven modelsof manufacturing systems. To combine the insights in modelingand control obtained in both time and event domain, it is usefulto create a coupling between those two domains.This paper describes modeling techniques in both timedomain and event domain for a class of manufacturing systemsand establishes a generic coupling between two model descriptions.The coupling exists of two maps between the models’states, enabling real-time control of manufacturing systems.

Original language	English
Title of host publication	Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego
Place of Publication	United States, San Diego, CA
Publisher	Institute of Electrical and Electronics Engineers
Pages	6068-6073
DOIs	https://doi.org/10.1109/CDC.2006.377701
Publication status	Published - 2006
Event	45th IEEE Conference on Decision and Control (CDC 2006) - San Diego, United States Duration: 13 Dec 2006 → 15 Dec 2006 Conference number: 45 http://www.ieeecss.org/CAB/conferences/cdc2006/

Conference

Conference	45th IEEE Conference on Decision and Control (CDC 2006)
Abbreviated title	CDC 2006
Country	United States
City	San Diego
Period	13/12/06 → 15/12/06
Internet address	http://www.ieeecss.org/CAB/conferences/cdc2006/

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title = "Coupling event domain and time domain models for manufacturing systems",

abstract = "Manufacturing systems are often characterizedas discrete event systems (DES) and consequently, these systemsare modeled with discrete event models. For certaindiscrete event modeling paradigms, control theory/techniqueshave been developed in event domain. However, from a controlor performance perspective, a lot of notions are time related,like stability, settling time, transient behavior, throughput,flow time, efficiency, etc. Moreover, if we also consider market/customer requirements, almost all requirements are withintime perspective: due dates, deliverability, earliness, tardiness,etc. Therefore, it is also useful to have time driven modelsof manufacturing systems. To combine the insights in modelingand control obtained in both time and event domain, it is usefulto create a coupling between those two domains.This paper describes modeling techniques in both timedomain and event domain for a class of manufacturing systemsand establishes a generic coupling between two model descriptions.The coupling exists of two maps between the models{\textquoteright}states, enabling real-time control of manufacturing systems.",

author = "{Eekelen, van}, J.A.W.M. and A.A.J. Lefeber and J.E. Rooda",

year = "2006",

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publisher = "Institute of Electrical and Electronics Engineers",

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Eekelen, van, JAWM , Lefeber, AAJ & Rooda, JE 2006, Coupling event domain and time domain models for manufacturing systems. in Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego. Institute of Electrical and Electronics Engineers, United States, San Diego, CA, pp. 6068-6073, 45th IEEE Conference on Decision and Control (CDC 2006), San Diego, United States, 13/12/06. https://doi.org/10.1109/CDC.2006.377701

Coupling event domain and time domain models for manufacturing systems. / Eekelen, van, J.A.W.M.; Lefeber, A.A.J.; Rooda, J.E.

Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego. United States, San Diego, CA : Institute of Electrical and Electronics Engineers, 2006. p. 6068-6073.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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