Correlative microscopic characterization of nanoscale assemblies at interfaces

Michael Alfonsus Beuwer

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

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Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Applied Physics
Supervisors/Advisors
  • Zijlstra, Peter, Promotor
  • Prins, Menno W.J., Copromotor
Award date15 Dec 2020
Place of PublicationEindhoven
Publisher
Print ISBNs978-94-641-9072-4
Publication statusPublished - 15 Dec 2020

Bibliographical note

Proefschrift.

Promotion : time and place

  • 13:30h, Auditorium, Collegezaal 4

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