Correlative microscopic characterization of nanoscale assemblies at interfaces

Michael Alfonsus Beuwer

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

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Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Applied Physics and Science Education
Supervisors/Advisors	Zijlstra, Peter, Promotor Prins, Menno W.J., Copromotor
Award date	15 Dec 2020
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Print ISBNs	978-94-641-9072-4
Publication status	Published - 15 Dec 2020

Proefschrift.

Promotion : time and place

@phdthesis{95257d1e7d374f899593927b143c9f0e,

title = "Correlative microscopic characterization of nanoscale assemblies at interfaces",

author = "Beuwer, {Michael Alfonsus}",

note = "Proefschrift.",

year = "2020",

month = dec,

day = "15",

language = "English",

isbn = "978-94-641-9072-4",

publisher = "Technische Universiteit Eindhoven",

type = "Phd Thesis 1 (Research TU/e / Graduation TU/e)",

school = "Applied Physics and Science Education",

}