Correlated twins in nanowires

M.A. Verheijen, R.E. Algra, W.J.P. Enckevort, van, E. Vlieg, L.F. Feiner, W.G.G. Immink, R. Theissmann, E.P.A.M. Bakkers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Abstract

Semiconducting nanowires offer the possibility of nearly unlimited complex bottom-up design which allows for new device concepts. The control in defects (i.e. twin planes) and the crystal structure are crucial for an optimal device performance. Normally twin planes occur randomly during growth, leading to imperfection in the crystal quality of the nanowire, resulting in electronic and optical barriers.
Original languageEnglish
Title of host publicationProceedings of the 16th Microscopy & Microanalysis Conference, 1-5 August 2010, Portland, OR, USA
Pages1808-1809
DOIs
Publication statusPublished - 2010
Eventconference; 16th Microscopy & Microanalysis Conference; 2010-08-01; 2010-08-05 -
Duration: 1 Aug 20105 Aug 2010

Publication series

NameMicroscopy and Microanalysis
NumberSupplement 2
Volume16
ISSN (Print)1431-9276

Conference

Conferenceconference; 16th Microscopy & Microanalysis Conference; 2010-08-01; 2010-08-05
Period1/08/105/08/10
Other16th Microscopy & Microanalysis Conference

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