Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

Patrick C. Deenen (Corresponding author)
, Jeroen Middelhuis
, Alp Akcay
, Ivo J.B.F. Adan

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2024
Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
Deenen, P. C. (Corresponding author), Middelhuis, J., Akcay, A. & Adan, I. J. B. F., Jun 2024, In: Flexible Services and Manufacturing Journal. 36, 2, p. 567-596 30 p.
Research output: Contribution to journal › Article › Academic › peer-review

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