Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

Patrick C. Deenen; Jeroen Middelhuis; Alp Akcay; Ivo J.B.F. Adan

doi:10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

Patrick C. Deenen (Corresponding author)
, Jeroen Middelhuis
, Alp Akcay
, Ivo J.B.F. Adan

Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review

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Abstract

Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)

Original language	English
Pages (from-to)	597-598
Number of pages	2
Journal	Flexible Services and Manufacturing Journal
Volume	36
Issue number	2
DOIs	https://doi.org/10.1007/s10696-023-09504-y
Publication status	Published - Jun 2024

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Deenen, P. C., Middelhuis, J., Akcay, A., & Adan, I. J. B. F. (2024). Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). Flexible Services and Manufacturing Journal, 36(2), 597-598. https://doi.org/10.1007/s10696-023-09504-y

Deenen, Patrick C. ; Middelhuis, Jeroen ; Akcay, Alp et al. / Correction to : Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). In: Flexible Services and Manufacturing Journal. 2024 ; Vol. 36, No. 2. pp. 597-598.

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abstract = "Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)",

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language = "English",

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Deenen, PC, Middelhuis, J, Akcay, A & Adan, IJBF 2024, 'Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)', Flexible Services and Manufacturing Journal, vol. 36, no. 2, pp. 597-598. https://doi.org/10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). / Deenen, Patrick C. (Corresponding author); Middelhuis, Jeroen; Akcay, Alp et al.
In: Flexible Services and Manufacturing Journal, Vol. 36, No. 2, 06.2024, p. 597-598.

Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review

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AU - Deenen, Patrick C.

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AU - Adan, Ivo J.B.F.

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N2 - Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)

AB - Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)

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M3 - Comment/Letter to the editor

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SP - 597

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JO - Flexible Services and Manufacturing Journal

JF - Flexible Services and Manufacturing Journal

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Deenen PC, Middelhuis J, Akcay A, Adan IJBF. Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). Flexible Services and Manufacturing Journal. 2024 Jun;36(2):597-598. doi: 10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

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Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions

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