Correcting for contact geometry in Seebeck coefficient measurements of thin film devices

S. Reenen, van, M. Kemerink

Research output: Contribution to journalArticleAcademicpeer-review

46 Citations (Scopus)
216 Downloads (Pure)

Abstract

Driven by promising recent results, there has been a revived interest in the thermoelectric properties of organic (semi)conductors. Concomitantly, there is a need to probe the Seebeck coefficient S of modestly conducting materials in thin film geometry. Here we show that geometries that seem desirable from a signal-to-noise perspective may induce systematic errors in the measured value of S, Sm, by a factor 3 or more. The enhancement of Sm by the device geometry is related to competing conduction paths outside the region between the electrodes. We derive a universal scaling curve that allows correcting for this and show that structuring the semiconductor is not needed for the optimal electrode configuration, being a set of narrow, parallel strips.
Original languageEnglish
Pages (from-to)2250-2255
Number of pages5
JournalOrganic Electronics
Volume15
Issue number10
DOIs
Publication statusPublished - 2014

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