Control-aware test architecture design for modular SOC testing

S.K. Goel, E.J. Marinissen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

30 Citations (Scopus)

Abstract

This paper deals with control-aware test architecture design for SOCs. The term test control refers to the control of mode of operation of all modules connected in different TAMs and the execution of the modules tests. We classify test control into two categories: (1) pseudo-static test control and (2) dynamic test control. Pseudo-static test control can be provided by means of a shift-register, where dynamic test control requires dedicated test pins. As the total number of chip pins available for test is limited, a large number of test control pins results in less TAM bandwidth available for test data. Therefore test architecture design should take the test control into account. To deal with pseudo-static test control for a given test architecture, we present two test strategies and discuss their impact on the corresponding test schedule. For dynamic test control, we present pin-constrained design of test architectures. Experimental results for the ITC'02 SOC test benchmarks show that the new pin-constrained design algorithm can save tip to 42 % in test time compared to the test times obtained from a conventional architecture design procedure.
Original languageEnglish
Title of host publicationThe Eighth IEEE European Test Workshop, 2003. Proceedings
Pages57-62
DOIs
Publication statusPublished - 2003
Externally publishedYes
Event8th IEEE European Test Workshop 2003 - Crowne Plaza Hotel, Maastricht, Netherlands
Duration: 28 May 200328 May 2003
Conference number: 8
http://www.ieee-ets.org/past_events/etw03/

Conference

Conference8th IEEE European Test Workshop 2003
Abbreviated titleETW'03
Country/TerritoryNetherlands
CityMaastricht
Period28/05/0328/05/03
Internet address

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