Contamination phenomena in the electron probe microanalyzer

G.F. Bastin, H.J.M. Heijligers

Research output: Contribution to journal › Article › Academic

2 Downloads (Pure)

Abstract

No abstract.

Original language	English
Pages (from-to)	325-328
Number of pages	4
Journal	Microbeam Analysis : Proceedings of the Annual Conference of the Microbeam Analysis Society
Volume	23
Publication status	Published - 1988

@article{d06ced9fbc8f485abf24e253056b26b5,

title = "Contamination phenomena in the electron probe microanalyzer",

abstract = "No abstract.",

author = "G.F. Bastin and H.J.M. Heijligers",

year = "1988",

language = "English",

volume = "23",

pages = "325--328",

journal = "Microbeam Analysis : Proceedings of the Annual Conference of the Microbeam Analysis Society",

issn = "0278-1727",

}

TY - JOUR

T1 - Contamination phenomena in the electron probe microanalyzer

AU - Bastin, G.F.

AU - Heijligers, H.J.M.

PY - 1988

Y1 - 1988

N2 - No abstract.

AB - No abstract.

M3 - Article

SN - 0278-1727

VL - 23

SP - 325

EP - 328

JO - Microbeam Analysis : Proceedings of the Annual Conference of the Microbeam Analysis Society

JF - Microbeam Analysis : Proceedings of the Annual Conference of the Microbeam Analysis Society

ER -