Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach

Antonio Barion; Martijn J.H. Anthonissen; Jan H.M. ten Thije Boonkkamp; Wilbert L. IJzerman

doi:10.1364/JOSAA.487343

Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach

Antonio Barion (Corresponding author), Martijn J.H. Anthonissen, Jan H.M. ten Thije Boonkkamp, Wilbert L. IJzerman

Computational Illumination Optics

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

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Abstract

We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment, and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.

Original language	English
Pages (from-to)	1215-1224
Number of pages	10
Journal	Journal of the Optical Society of America A, Optics, Image Science and Vision
Volume	40
Issue number	6
DOIs	https://doi.org/10.1364/JOSAA.487343
Publication status	Published - 1 Jun 2023

Funding

Topconsortium voor Kennis en Innovatie (\u201CPhotolitho MCS\u201D (TKI-HTSM 19.0162)). The authors thank Teus Tukker (ASML) for his fruitful remarks.

Funders	Funder number
Topconsortium voor Kennis en Innovatie	TKI-HTSM 19.0162

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10.1364/JOSAA.487343

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abstract = "We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment, and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.",

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Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach. / Barion, Antonio (Corresponding author); Anthonissen, Martijn J.H.; ten Thije Boonkkamp, Jan H.M. et al.
In: Journal of the Optical Society of America A, Optics, Image Science and Vision, Vol. 40, No. 6, 01.06.2023, p. 1215-1224.

Research output: Contribution to journal › Article › Academic › peer-review

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AU - Anthonissen, Martijn J.H.

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AU - IJzerman, Wilbert L.

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AB - We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment, and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.

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Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach

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