TY - JOUR
T1 - Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach
AU - Barion, Antonio
AU - Anthonissen, Martijn J.H.
AU - ten Thije Boonkkamp, Jan H.M.
AU - IJzerman, Wilbert L.
PY - 2023/2/8
Y1 - 2023/2/8
N2 - We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.
AB - We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.
U2 - 10.48550/arXiv.2302.03960
DO - 10.48550/arXiv.2302.03960
M3 - Article
SN - 2331-8422
JO - arXiv
JF - arXiv
M1 - 2302.03960
ER -