The objective of electromagnetic compatibility (EMC) is to ensure the peaceful coexistence and the proper functioning of electronic devices in their environment. To this end, EMC designers need to understand and model interactions between electromagnetic fields and material systems. However, the accuracy, the validity and the usefulness of the models established by EMC designers depends on their knowledge of the configuration that they are modeling. Such knowledge cannot always be guaranteed due to an excessive complexity or variability or an insufficient characterization of the configuration. The present thesis addresses this issue via a stochastic approach, which assesses the effect of parametric uncertainties on the response variables of numerical models employed in EMC.
|Qualification||Doctor of Philosophy|
|Award date||20 Oct 2009|
|Place of Publication||Eindhoven|
|Publication status||Published - 2009|