Comparative study of deep learning methods for one-shot image classification (abstract)

J. van den Bogaert, H. Mohseni, Mahmoud Khodier, Yuliyan Stoyanov, D.C. Mocanu, V. Menkovski

Research output: Contribution to conferenceAbstractAcademic

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Abstract

Training deep learning models for images classification requires large amount of labeled data to overcome the challenges of overfitting and underfitting. Usually, in many practical applications, these labeled data are not available. In an attempt to solve this problem, the one-shot learning paradigm tries to create machine learning models capable to learn well from one or (maximum) few labeled examples per class. To understand better the behavior of various deep learning models and approaches for one-shot learning, in this abstract, we perform a comparative study of the most used ones, on a challenging real-world dataset, i.e Fashion-MNIST.
Original languageEnglish
Publication statusPublished - 1 Dec 2017
EventDutch-Belgian Database Day 2017 (DBDBD 2017) - Eindhoven, Netherlands
Duration: 1 Dec 20171 Dec 2017

Workshop

WorkshopDutch-Belgian Database Day 2017 (DBDBD 2017)
CountryNetherlands
CityEindhoven
Period1/12/171/12/17

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