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Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals
F. Schmidt, S. Müller, H. Von Wenckstern, C.P. Dietrich, R. Heinhold, H.S. Kim, M.W. Allen, M. Grundmann
Research output: Contribution to journal › Article › Academic › peer-review
9
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(Scopus)