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Compact physical model of a-IGZO TFTs for circuit simulation

  • M. Ghittorelli
  • , F. Torricelli
  • , C. Garripoli
  • , J.L.J.P. Van Der Steen
  • , G.H. Gelinck
  • , S. Abdinia
  • , E. Cantatore
  • , Z.M. Kovacs-Vajna

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Amorphous InGaZnO (a-IGZO) is a candidate material for thin-film transistors (TFTs) owing to its large electron mobility. The development of high functionality circuits requires accurate and efficient circuit simulation that, in turn, is based on compact physical a-IGZO TFTs models. Here we propose a compact physical-based and analytical model of the drain current of a-IGZO TFTs. The model accounts for both trapped and free charges by means of an effective density of states that accurately approximate the actual a-IGZO density of states in the energy range relevant for the TFT operation. The model is implemented in a circuit simulator and it is validated with the measurements of both coplanar and staggered a-IGZO TFTs fabricated on flexible substrates.

Original languageEnglish
Title of host publication2017 47th European Solid-State Device Research Conference, ESSDERC 2017, 11-14 September 2017, Leuven, Belgium
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages98-101
Number of pages4
ISBN (Electronic)978-1-5090-5978-2
ISBN (Print)978-1-5090-5979-9
DOIs
Publication statusPublished - 12 Oct 2017
Event47th European Solid-State Device Research Conference, ESSDERC 2017 - Leuven, Belgium
Duration: 11 Sept 201714 Sept 2017

Conference

Conference47th European Solid-State Device Research Conference, ESSDERC 2017
Country/TerritoryBelgium
CityLeuven
Period11/09/1714/09/17

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