Abstract
Amorphous InGaZnO (a-IGZO) is a candidate material for thin-film transistors (TFTs) owing to its large electron mobility. The development of high functionality circuits requires accurate and efficient circuit simulation that, in turn, is based on compact physical a-IGZO TFTs models. Here we propose a compact physical-based and analytical model of the drain current of a-IGZO TFTs. The model accounts for both trapped and free charges by means of an effective density of states that accurately approximate the actual a-IGZO density of states in the energy range relevant for the TFT operation. The model is implemented in a circuit simulator and it is validated with the measurements of both coplanar and staggered a-IGZO TFTs fabricated on flexible substrates.
Original language | English |
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Title of host publication | 2017 47th European Solid-State Device Research Conference, ESSDERC 2017, 11-14 September 2017, Leuven, Belgium |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 98-101 |
Number of pages | 4 |
ISBN (Electronic) | 978-1-5090-5978-2 |
ISBN (Print) | 978-1-5090-5979-9 |
DOIs | |
Publication status | Published - 12 Oct 2017 |
Event | 47th European Solid-State Device Research Conference, ESSDERC 2017 - Leuven, Belgium Duration: 11 Sept 2017 → 14 Sept 2017 |
Conference
Conference | 47th European Solid-State Device Research Conference, ESSDERC 2017 |
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Country/Territory | Belgium |
City | Leuven |
Period | 11/09/17 → 14/09/17 |