TY - JOUR
T1 - Compact high-brightness soft X-ray Cherenkov sources
AU - Knulst, W.
AU - Luiten, O.J.
AU - Verhoeven, J.
PY - 2004
Y1 - 2004
N2 - Compact narrow-band high-brightness soft X-ray sources based on the Cherenkov effect are very promising. We discuss the theoretical basis for this novel electron-accelerator-based source. We present results of experiments, which confirm the theoretical expectations and demonstrate that intense narrow-band Cherenkov light can be produced at the silicon L-edge (99.7 eV) and, in the water window, at the titanium L-edge (453 eV) and the vanadium L-edge (512 eV). On the basis of theory and experiment, we show that a compact high-brightness Cherenkov source may be realized, which fulfills the requirements for practical soft X-ray microscopy and photoelectron spectroscopy.
AB - Compact narrow-band high-brightness soft X-ray sources based on the Cherenkov effect are very promising. We discuss the theoretical basis for this novel electron-accelerator-based source. We present results of experiments, which confirm the theoretical expectations and demonstrate that intense narrow-band Cherenkov light can be produced at the silicon L-edge (99.7 eV) and, in the water window, at the titanium L-edge (453 eV) and the vanadium L-edge (512 eV). On the basis of theory and experiment, we show that a compact high-brightness Cherenkov source may be realized, which fulfills the requirements for practical soft X-ray microscopy and photoelectron spectroscopy.
U2 - 10.1109/JSTQE.2004.837738
DO - 10.1109/JSTQE.2004.837738
M3 - Article
SN - 1077-260X
VL - 10
SP - 1414
EP - 1425
JO - IEEE Journal of Selected Topics in Quantum Electronics
JF - IEEE Journal of Selected Topics in Quantum Electronics
IS - 6
ER -