Abstract
The paper ``Normal and anomalous behaviour of the RTS noise amplitude in forward biased in InGaAs/InP photodiodes'' presents a study of the RTS noise amplitude in forward biased InGaAs/InP photodetectors. According to the values of the ideality factor ZRTS of the RTS current noise amplitude an anomalous behaviour (ZRTS10.5) has been observed for the ®rst time. Fluctuations in the multicarrier Auger recombination process are assumed to be responsible for anomalous RTS with ZRTS
Original language | English |
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Pages (from-to) | 691-692 |
Number of pages | 2 |
Journal | Solid-State Electronics |
Volume | 43 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1999 |