Combining metrics data and the structure of UML models using GIS visualization approaches

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the International Conference on Information Technology (ITCC 2005, Las Vegas NV, USA, April 4-6, 2005)
Editors	M. Kato
Place of Publication	Los Alamitos CA, USA
Publisher	IEEE Computer Society
Pages	322-326
Volume	2
ISBN (Print)	0-7695-2315-3
DOIs	https://doi.org/10.1109/ITCC.2005.102
Publication status	Published - 2005

Access to Document

@inproceedings{7e81895cc46242b0a23f3110a52828a3,

title = "Combining metrics data and the structure of UML models using GIS visualization approaches",

author = "C.F.J. Lange and M.R.V. Chaudron",

year = "2005",

doi = "10.1109/ITCC.2005.102",

language = "English",

isbn = "0-7695-2315-3",

volume = "2",

pages = "322--326",

editor = "M. Kato",

booktitle = "Proceedings of the International Conference on Information Technology (ITCC 2005, Las Vegas NV, USA, April 4-6, 2005)",

publisher = "IEEE Computer Society",

address = "United States",

}

Combining metrics data and the structure of UML models using GIS visualization approaches. / Lange, C.F.J.; Chaudron, M.R.V.
Proceedings of the International Conference on Information Technology (ITCC 2005, Las Vegas NV, USA, April 4-6, 2005). ed. / M. Kato. Vol. 2 Los Alamitos CA, USA: IEEE Computer Society, 2005. p. 322-326.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Combining metrics data and the structure of UML models using GIS visualization approaches

AU - Lange, C.F.J.

AU - Chaudron, M.R.V.

PY - 2005

Y1 - 2005

U2 - 10.1109/ITCC.2005.102

DO - 10.1109/ITCC.2005.102

M3 - Conference contribution

SN - 0-7695-2315-3

VL - 2

SP - 322

EP - 326

BT - Proceedings of the International Conference on Information Technology (ITCC 2005, Las Vegas NV, USA, April 4-6, 2005)

A2 - Kato, M.

PB - IEEE Computer Society

CY - Los Alamitos CA, USA

ER -