Abstract
Clustertools play an increasing important role in modern semiconductor fabs. These tools are complex and have a large impact on fab performance. In this paper, a structured approach is presented to give insight in the dynamic behavior of clustertools and to optimize their performance. The approach is applied to the metal area of a waferfab. Scheduling rules are defined for clustertools of this area. A dynamic simulation model is used to evaluate the rules. Experiments show that an average improvement of 8 percent on cycle time and throughput is achieved by usage of scheduling rules
Original language | English |
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Title of host publication | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium, October 11-13, 1999, Santa Clara, California, 1999 |
Place of Publication | Piscawatay |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 89-92 |
ISBN (Print) | 0-7803-5403-6 |
DOIs | |
Publication status | Published - 1999 |