Closed-loop performance diagnosis using prediction error identification

A. Mesbah, X. Bombois, J.H.A. Ludlage, P.M.J. Hof, Van den

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Abstract

This paper presents a methodology to detect the origin of closed-loop performance degradation of model-based control systems. The approach exploits the statistical hypothesis testing framework. The decision rule consists of examining if an identified model of the true system lies in a set containing all models that fulfill the closed-loop performance requirements. This allows us to determine whether performance degradation arises from changes in system dynamics or from variations in disturbance characteristics. The probability of making an erroneous decision is estimated a posteriori using the known distribution of the identified model with respect to the unknown true system.
Original languageEnglish
Title of host publicationProceedings of the 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC), December 12-15, 2011, Orlando, Florida
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages2969-2974
Number of pages6
ISBN (Electronic)978-1-61284-801-3
ISBN (Print)978-1-61284-800-6
DOIs
Publication statusPublished - 2011
Event2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011 - Hilton Orlando Bonnet Creek, Orlando, FL, United States
Duration: 12 Dec 201115 Dec 2011
Conference number: 50
http://www.ieeecss.org/CAB/conferences/cdcecc2011/

Conference

Conference2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011
Abbreviated titleCDC-ECC 2011
CountryUnited States
CityOrlando, FL
Period12/12/1115/12/11
Internet address

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  • Cite this

    Mesbah, A., Bombois, X., Ludlage, J. H. A., & Hof, Van den, P. M. J. (2011). Closed-loop performance diagnosis using prediction error identification. In Proceedings of the 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC), December 12-15, 2011, Orlando, Florida (pp. 2969-2974). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CDC.2011.6161058