Circuit yield of organic integrated electronics

E. Cantatore; C. M. Hart; M. Digioia; G.H. Gelinck; T.C.T. Geuns; H.E.A. Huitema; L.R.R. Schrijnemakers; E. Van Veenendaal; D.M. de Leeuw

doi:10.1109/ISSCC.2003.1234346

Circuit yield of organic integrated electronics

E. Cantatore, C. M. Hart, M. Digioia, G.H. Gelinck, T.C.T. Geuns, H.E.A. Huitema, L.R.R. Schrijnemakers, E. Van Veenendaal, D.M. de Leeuw

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

Original language	English
Title of host publication	2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Number of pages	10
ISBN (Print)	0780377079
DOIs	https://doi.org/10.1109/ISSCC.2003.1234346
Publication status	Published - 23 Jul 2003
Externally published	Yes
Event	50th IEEE International Solid-State Circuits Conference, ISSCC 2003 - San Francisco, United States Duration: 9 Feb 2003 → 13 Feb 2003 Conference number: 50

Conference

Conference	50th IEEE International Solid-State Circuits Conference, ISSCC 2003
Abbreviated title	ISSCC 2003
Country/Territory	United States
City	San Francisco
Period	9/02/03 → 13/02/03

Access to Document

10.1109/ISSCC.2003.1234346

Cite this

Cantatore, E., Hart, C. M., Digioia, M., Gelinck, G. H., Geuns, T. C. T., Huitema, H. E. A., Schrijnemakers, L. R. R., Van Veenendaal, E., & de Leeuw, D. M. (2003). Circuit yield of organic integrated electronics. In 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC Article paper 21.8 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISSCC.2003.1234346

@inproceedings{cada860cb38f472eac9e3764d9a8f276,

title = "Circuit yield of organic integrated electronics",

abstract = "Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.",

author = "E. Cantatore and Hart, {C. M.} and M. Digioia and G.H. Gelinck and T.C.T. Geuns and H.E.A. Huitema and L.R.R. Schrijnemakers and {Van Veenendaal}, E. and {de Leeuw}, D.M.",

year = "2003",

month = jul,

day = "23",

doi = "10.1109/ISSCC.2003.1234346",

language = "English",

isbn = "0780377079",

booktitle = "2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "50th IEEE International Solid-State Circuits Conference, ISSCC 2003, ISSCC 2003 ; Conference date: 09-02-2003 Through 13-02-2003",

}

Cantatore, E, Hart, CM, Digioia, M, Gelinck, GH, Geuns, TCT, Huitema, HEA, Schrijnemakers, LRR, Van Veenendaal, E & de Leeuw, DM 2003, Circuit yield of organic integrated electronics. in 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC., paper 21.8, Institute of Electrical and Electronics Engineers, Piscataway, 50th IEEE International Solid-State Circuits Conference, ISSCC 2003, San Francisco, California, United States, 9/02/03. https://doi.org/10.1109/ISSCC.2003.1234346

Circuit yield of organic integrated electronics. / Cantatore, E.; Hart, C. M.; Digioia, M. et al.
2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. Piscataway: Institute of Electrical and Electronics Engineers, 2003. paper 21.8.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Circuit yield of organic integrated electronics

AU - Cantatore, E.

AU - Hart, C. M.

AU - Digioia, M.

AU - Gelinck, G.H.

AU - Geuns, T.C.T.

AU - Huitema, H.E.A.

AU - Schrijnemakers, L.R.R.

AU - Van Veenendaal, E.

AU - de Leeuw, D.M.

N1 - Conference code: 50

PY - 2003/7/23

Y1 - 2003/7/23

N2 - Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

AB - Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0038645218&partnerID=8YFLogxK

U2 - 10.1109/ISSCC.2003.1234346

DO - 10.1109/ISSCC.2003.1234346

M3 - Conference contribution

SN - 0780377079

BT - 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 50th IEEE International Solid-State Circuits Conference, ISSCC 2003

Y2 - 9 February 2003 through 13 February 2003

ER -

Circuit yield of organic integrated electronics

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this