Circuit yield of organic integrated electronics

E. Cantatore, C. M. Hart, M. Digioia, G.H. Gelinck, T.C.T. Geuns, H.E.A. Huitema, L.R.R. Schrijnemakers, E. Van Veenendaal, D.M. de Leeuw

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Abstract

Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

Original languageEnglish
Title of host publication2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages10
ISBN (Print)0780377079
DOIs
Publication statusPublished - 23 Jul 2003
Externally publishedYes
Event50th IEEE International Solid-State Circuits Conference, ISSCC 2003 - San Francisco, United States
Duration: 13 Feb 200313 Feb 2003
Conference number: 50

Conference

Conference50th IEEE International Solid-State Circuits Conference, ISSCC 2003
Abbreviated titleISSCC 2003
Country/TerritoryUnited States
CitySan Francisco
Period13/02/0313/02/03

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