Circuit yield of organic integrated electronics

E. Cantatore, C. M. Hart, M. Digioia, G.H. Gelinck, T.C.T. Geuns, H.E.A. Huitema, L.R.R. Schrijnemakers, E. Van Veenendaal, D.M. de Leeuw

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Citations (Scopus)

Abstract

Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

Original languageEnglish
Title of host publication2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages10
ISBN (Print)0780377079
DOIs
Publication statusPublished - 23 Jul 2003
Externally publishedYes
Event2003 IEEE International Solid-State Circuits Conference (ISSCC) - San Francisco, United States
Duration: 13 Feb 200313 Feb 2003

Conference

Conference2003 IEEE International Solid-State Circuits Conference (ISSCC)
CountryUnited States
CitySan Francisco
Period13/02/0313/02/03

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  • Cite this

    Cantatore, E., Hart, C. M., Digioia, M., Gelinck, G. H., Geuns, T. C. T., Huitema, H. E. A., Schrijnemakers, L. R. R., Van Veenendaal, E., & de Leeuw, D. M. (2003). Circuit yield of organic integrated electronics. In 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC [paper 21.8] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISSCC.2003.1234346