Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model

E.V. Rebrov; M. Creatore; L.N. Protasova; O. Muraza; M.C.M. Sanden, van de; J.C. Schouten

Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model

E.V. Rebrov, M. Creatore, L.N. Protasova, O. Muraza, M.C.M. Sanden, van de, J.C. Schouten

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium
Place of Publication	Belgium, Namur
Pages	P-054
Publication status	Published - 2008

Cite this

Rebrov, E. V., Creatore, M., Protasova, L. N., Muraza, O., Sanden, van de, M. C. M., & Schouten, J. C. (2008). Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model. In Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium (pp. P-054).

Rebrov, E.V. ; Creatore, M. ; Protasova, L.N. ; Muraza, O. ; Sanden, van de, M.C.M. ; Schouten, J.C. / Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model. Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium. Belgium, Namur, 2008. pp. P-054

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title = "Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model",

author = "E.V. Rebrov and M. Creatore and L.N. Protasova and O. Muraza and {Sanden, van de}, M.C.M. and J.C. Schouten",

year = "2008",

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pages = "P--054",

booktitle = "Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium",

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Rebrov, EV , Creatore, M, Protasova, LN, Muraza, O, Sanden, van de, MCM & Schouten, JC 2008, Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model. in Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium. Belgium, Namur, pp. P-054.

Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model. / Rebrov, E.V.; Creatore, M.; Protasova, L.N.; Muraza, O.; Sanden, van de, M.C.M.; Schouten, J.C.

Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium. Belgium, Namur, 2008. p. P-054.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Muraza, O.

AU - Sanden, van de, M.C.M.

AU - Schouten, J.C.

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M3 - Conference contribution

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BT - Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium

CY - Belgium, Namur

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Rebrov EV , Creatore M, Protasova LN, Muraza O, Sanden, van de MCM, Schouten JC. Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model. In Mesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium. Belgium, Namur. 2008. p. P-054