Characterization of the porous structure of mesoporous thin films by ellipsometric porosimetry using the modified Deriaguin-Broekhoff-De Boer model

E.V. Rebrov, M. Creatore, L.N. Protasova, O. Muraza, M.C.M. Sanden, van de, J.C. Schouten

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationMesostructured Materials: Design and Opportunities : proceedings of the 6th Int. Mesostructured Materials Symposium (IMMS 2008), September 9-11 2008, Namur, Belgium
Place of PublicationBelgium, Namur
PagesP-054
Publication statusPublished - 2008

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