TY - JOUR
T1 - Characterization of polymer solar cells by TOF-SIMS depth profiling
AU - Bulle-Lieuwma, C.W.T.
AU - Gennip, van, W.J.H.
AU - Duren, van, J.K.J.
AU - Jonkheijm, P.
AU - Janssen, R.A.J.
AU - Niemantsverdriet, J.W.
PY - 2003
Y1 - 2003
N2 - Solar cells consisting of polymer layers sandwiched between a transparent electrode on glass and a metal top electrode are studied using dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS) in dual-beam mode. Because depth profiling of polymers and polymer-metal stacks is a relatively new field the craters were thoroughly studied by environmental SEM (ESEM), interferometry, surface profilometry and tapping mode AFM. A huge increase in crater bottom roughness was obsd. when starting from the aluminum top layer going in depth, resulting in a loss of depth resoln. layer-to-layer diffusion and contaminants at buried interfaces can be extd. from the depth profiles when taking into account the loss of depth resoln. [on SciFinder (R)]
AB - Solar cells consisting of polymer layers sandwiched between a transparent electrode on glass and a metal top electrode are studied using dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS) in dual-beam mode. Because depth profiling of polymers and polymer-metal stacks is a relatively new field the craters were thoroughly studied by environmental SEM (ESEM), interferometry, surface profilometry and tapping mode AFM. A huge increase in crater bottom roughness was obsd. when starting from the aluminum top layer going in depth, resulting in a loss of depth resoln. layer-to-layer diffusion and contaminants at buried interfaces can be extd. from the depth profiles when taking into account the loss of depth resoln. [on SciFinder (R)]
U2 - 10.1016/S0169-4332(02)00756-0
DO - 10.1016/S0169-4332(02)00756-0
M3 - Article
SN - 0169-4332
VL - 203-204
SP - 547
EP - 550
JO - Applied Surface Science
JF - Applied Surface Science
ER -