Characterization of polymer solar cells by TOF-SIMS depth profiling

C.W.T. Bulle-Lieuwma, W.J.H. Gennip, van, J.K.J. Duren, van, P. Jonkheijm, R.A.J. Janssen, J.W. Niemantsverdriet

Research output: Contribution to journalArticleAcademicpeer-review

136 Citations (Scopus)
1 Downloads (Pure)

Abstract

Solar cells consisting of polymer layers sandwiched between a transparent electrode on glass and a metal top electrode are studied using dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS) in dual-beam mode. Because depth profiling of polymers and polymer-metal stacks is a relatively new field the craters were thoroughly studied by environmental SEM (ESEM), interferometry, surface profilometry and tapping mode AFM. A huge increase in crater bottom roughness was obsd. when starting from the aluminum top layer going in depth, resulting in a loss of depth resoln. layer-to-layer diffusion and contaminants at buried interfaces can be extd. from the depth profiles when taking into account the loss of depth resoln. [on SciFinder (R)]
Original languageEnglish
Pages (from-to)547-550
JournalApplied Surface Science
Volume203-204
DOIs
Publication statusPublished - 2003

Fingerprint Dive into the research topics of 'Characterization of polymer solar cells by TOF-SIMS depth profiling'. Together they form a unique fingerprint.

Cite this