Characterization of Ge/Ag ohmic contacts for InP based nanophotonic devices

L. Shen, C.W.H.A. Wullems, P.J. Veldhoven, van, V.M. Dolores Calzadilla, D. Heiss, J.J.G.M. Tol, van der, M.K. Smit, H.P.M.M. Ambrosius

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Original languageEnglish
Title of host publicationProceedings of the 19th Annual Symposium of the IEEE Photonics Benelux Chapter, 3-4 November 2014, Enschede, The Netherlands
EditorsS.M. Garcia Blanco, K.J. Boller, M.A. Sefunc, D. Geuzebroek
Place of PublicationEnschede
PublisherTwente University
Pages177-180
ISBN (Print)978-90-365-3778-0
Publication statusPublished - 2014

Cite this

Shen, L., Wullems, C. W. H. A., Veldhoven, van, P. J., Dolores Calzadilla, V. M., Heiss, D., Tol, van der, J. J. G. M., Smit, M. K., & Ambrosius, H. P. M. M. (2014). Characterization of Ge/Ag ohmic contacts for InP based nanophotonic devices. In S. M. Garcia Blanco, K. J. Boller, M. A. Sefunc, & D. Geuzebroek (Eds.), Proceedings of the 19th Annual Symposium of the IEEE Photonics Benelux Chapter, 3-4 November 2014, Enschede, The Netherlands (pp. 177-180). Twente University.