Characterization of defects in integrated circuits : resources, models and applications

E.M.J.G. Bruls, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Information and Communication Technology (ICT)

    Research output: ThesisEngD Thesis

    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Jess, Jochen, Supervisor
    • Baker, K., External supervisor, External person
    • Camerik, F., External supervisor, External person
    Award date1 Jan 1992
    Place of PublicationEindhoven
    Print ISBNs90-5282-190-9
    Publication statusPublished - 1992

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