Characterization and modeling of thin film interface strength considering mode mixity

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada
Pages	1925-1930
Publication status	Published - 2007

Cite this

@inproceedings{0e2aa3e149f741378788996a5a842adb,

title = "Characterization and modeling of thin film interface strength considering mode mixity",

author = "A. Xiao and L. Wang and \{Driel, van\}, W.D. and L.J. Ernst and \{Sluis, van der\}, O. and D.G. Yang and G.Q. Zhang",

year = "2007",

language = "English",

pages = "1925--1930",

booktitle = "Proceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada",

}

Characterization and modeling of thin film interface strength considering mode mixity. / Xiao, A.; Wang, L.; Driel, van, W.D. et al.
Proceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada. 2007. p. 1925-1930.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Characterization and modeling of thin film interface strength considering mode mixity

AU - Xiao, A.

AU - Wang, L.

AU - Driel, van, W.D.

AU - Ernst, L.J.

AU - Sluis, van der, O.

AU - Yang, D.G.

AU - Zhang, G.Q.

PY - 2007

Y1 - 2007

M3 - Conference contribution

SP - 1925

EP - 1930

BT - Proceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada

ER -