Characterization and modeling of thin film interface strength considering mode mixity

A. Xiao, L. Wang, W.D. Driel, van, L.J. Ernst, O. Sluis, van der, D.G. Yang, G.Q. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada
Pages1925-1930
Publication statusPublished - 2007

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