Original language | English |
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Title of host publication | Proceedings of the Electronic Components and Technology Conference (ECTC 2007), United States, Reno, Nevada |
Pages | 1925-1930 |
Publication status | Published - 2007 |
Characterization and modeling of thin film interface strength considering mode mixity
A. Xiao, L. Wang, W.D. Driel, van, L.J. Ernst, O. Sluis, van der, D.G. Yang, G.Q. Zhang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
3
Citations
(Scopus)