Characterization and fatigue damage simulation in SAC solder joints

M.E. Erinc, P.J.G. Schreurs, G.Q. Zhang, M.G.D. Geers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

19 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich
Pages1287-1292
Publication statusPublished - 2004

Cite this

Erinc, M. E., Schreurs, P. J. G., Zhang, G. Q., & Geers, M. G. D. (2004). Characterization and fatigue damage simulation in SAC solder joints. In Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich (pp. 1287-1292)