Original language | English |
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Title of host publication | Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich |
Pages | 1287-1292 |
Publication status | Published - 2004 |
Characterization and fatigue damage simulation in SAC solder joints
M.E. Erinc, P.J.G. Schreurs, G.Q. Zhang, M.G.D. Geers
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
19
Citations
(Scopus)