Characterization and fatigue damage simulation in SAC solder joints

M.E. Erinc, P.J.G. Schreurs, G.Q. Zhang, M.G.D. Geers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich
Pages	1287-1292
Publication status	Published - 2004

Cite this

@inproceedings{47bbbb08a28b47b2925c35a4dc9e8a4d,

title = "Characterization and fatigue damage simulation in SAC solder joints",

author = "M.E. Erinc and P.J.G. Schreurs and G.Q. Zhang and M.G.D. Geers",

year = "2004",

language = "English",

pages = "1287--1292",

booktitle = "Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Z{\"u}rich",

}

Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich. 2004. p. 1287-1292.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review