Characterization and fatigue damage simulation in SAC solder joints

M.E. Erinc, P.J.G. Schreurs, G.Q. Zhang, M.G.D. Geers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

19 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Switzerland, Zürich
Publication statusPublished - 2004

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