Challenges in testing core-based system ICs

E.J. Marinissen, Y. Zorian

Research output: Contribution to journalArticleAcademicpeer-review

49 Citations (Scopus)


Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. We describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research.
Original languageEnglish
Pages (from-to)104-109
JournalIEEE Communications Magazine
Issue number6
Publication statusPublished - Jun 1999
Externally publishedYes


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