Challenges in testing core-based system ICs

E.J. Marinissen, Y. Zorian

Research output: Contribution to journalArticleAcademicpeer-review

47 Citations (Scopus)

Abstract

Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. We describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research.
Original languageEnglish
Pages (from-to)104-109
JournalIEEE Communications Magazine
Volume37
Issue number6
DOIs
Publication statusPublished - Jun 1999
Externally publishedYes

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