Bulk and contact 1/f noise in GaN TLM structures

R. Feyaerts, L.K.J. Vandamme, G. Trefan, M.C.J.C.M. Krämer, C. Zellweger

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publication31th European Solid-State Device Research Conference
EditorsH. Ryssel, G. Wachutka, H. Grunbacher
Place of PublicationBonchamps-les-Laval, France
PublisherFrontier Group
ISBN (Print)2-914601-01-8
Publication statusPublished - 2001
Eventconference; ESSDRC Nuremberg, Germany; 2001-09-11; 2001-09-13 -
Duration: 11 Sept 200113 Sept 2001


Conferenceconference; ESSDRC Nuremberg, Germany; 2001-09-11; 2001-09-13
OtherESSDRC Nuremberg, Germany

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