Bleaching dynamics in InAs self-assembled quantum dots

E.W. Bogaart, J.E.M. Haverkort, T. Mano, R. Nötzel, J.H. Wolter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

Carrier capture processes within the transient absorption spectrum of self-assembled quantum dots are investigated by means of time-resolved pump-probe differential reflection spectroscopy at various temperatures. The bleaching dynamics depends strongly on the excitation density. At low excitation densities the carrier capture process is governed by single LO-phonon emission whereas Auger effects dominate the overall capture process at high densities.
Original languageEnglish
Title of host publicationProceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA
Place of PublicationArizona, USA
Pages731-732
DOIs
Publication statusPublished - 2005

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X

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bleaching
quantum dots
Auger effect
excitation
pumps
absorption spectra
probes
spectroscopy
temperature

Cite this

Bogaart, E. W., Haverkort, J. E. M., Mano, T., Nötzel, R., & Wolter, J. H. (2005). Bleaching dynamics in InAs self-assembled quantum dots. In Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA (pp. 731-732). (AIP Conference Proceedings; Vol. 772). Arizona, USA. https://doi.org/10.1063/1.1994314
Bogaart, E.W. ; Haverkort, J.E.M. ; Mano, T. ; Nötzel, R. ; Wolter, J.H. / Bleaching dynamics in InAs self-assembled quantum dots. Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA. Arizona, USA, 2005. pp. 731-732 (AIP Conference Proceedings).
@inproceedings{02467b271a124723999c0481b30f1e37,
title = "Bleaching dynamics in InAs self-assembled quantum dots",
abstract = "Carrier capture processes within the transient absorption spectrum of self-assembled quantum dots are investigated by means of time-resolved pump-probe differential reflection spectroscopy at various temperatures. The bleaching dynamics depends strongly on the excitation density. At low excitation densities the carrier capture process is governed by single LO-phonon emission whereas Auger effects dominate the overall capture process at high densities.",
author = "E.W. Bogaart and J.E.M. Haverkort and T. Mano and R. N{\"o}tzel and J.H. Wolter",
year = "2005",
doi = "10.1063/1.1994314",
language = "English",
series = "AIP Conference Proceedings",
pages = "731--732",
booktitle = "Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA",

}

Bogaart, EW, Haverkort, JEM, Mano, T, Nötzel, R & Wolter, JH 2005, Bleaching dynamics in InAs self-assembled quantum dots. in Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA. AIP Conference Proceedings, vol. 772, Arizona, USA, pp. 731-732. https://doi.org/10.1063/1.1994314

Bleaching dynamics in InAs self-assembled quantum dots. / Bogaart, E.W.; Haverkort, J.E.M.; Mano, T.; Nötzel, R.; Wolter, J.H.

Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA. Arizona, USA, 2005. p. 731-732 (AIP Conference Proceedings; Vol. 772).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Bleaching dynamics in InAs self-assembled quantum dots

AU - Bogaart, E.W.

AU - Haverkort, J.E.M.

AU - Mano, T.

AU - Nötzel, R.

AU - Wolter, J.H.

PY - 2005

Y1 - 2005

N2 - Carrier capture processes within the transient absorption spectrum of self-assembled quantum dots are investigated by means of time-resolved pump-probe differential reflection spectroscopy at various temperatures. The bleaching dynamics depends strongly on the excitation density. At low excitation densities the carrier capture process is governed by single LO-phonon emission whereas Auger effects dominate the overall capture process at high densities.

AB - Carrier capture processes within the transient absorption spectrum of self-assembled quantum dots are investigated by means of time-resolved pump-probe differential reflection spectroscopy at various temperatures. The bleaching dynamics depends strongly on the excitation density. At low excitation densities the carrier capture process is governed by single LO-phonon emission whereas Auger effects dominate the overall capture process at high densities.

U2 - 10.1063/1.1994314

DO - 10.1063/1.1994314

M3 - Conference contribution

T3 - AIP Conference Proceedings

SP - 731

EP - 732

BT - Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA

CY - Arizona, USA

ER -

Bogaart EW, Haverkort JEM, Mano T, Nötzel R, Wolter JH. Bleaching dynamics in InAs self-assembled quantum dots. In Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA. Arizona, USA. 2005. p. 731-732. (AIP Conference Proceedings). https://doi.org/10.1063/1.1994314

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