Bleaching dynamics in InAs self-assembled quantum dots

E.W. Bogaart, J.E.M. Haverkort, T. Mano, R. Nötzel, J.H. Wolter

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

Carrier capture processes within the transient absorption spectrum of self-assembled quantum dots are investigated by means of time-resolved pump-probe differential reflection spectroscopy at various temperatures. The bleaching dynamics depends strongly on the excitation density. At low excitation densities the carrier capture process is governed by single LO-phonon emission whereas Auger effects dominate the overall capture process at high densities.
Original languageEnglish
Title of host publicationProceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA
Place of PublicationArizona, USA
Pages731-732
DOIs
Publication statusPublished - 2005
Event27th International Conference on the Physics of Semiconductors (ICPS-27), July 26-30, 2004, Arizona, USA - , United States
Duration: 26 Jul 200430 Jul 2004

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X

Conference

Conference27th International Conference on the Physics of Semiconductors (ICPS-27), July 26-30, 2004, Arizona, USA
Abbreviated titleICPS-27
CountryUnited States
Period26/07/0430/07/04

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    Bogaart, E. W., Haverkort, J. E. M., Mano, T., Nötzel, R., & Wolter, J. H. (2005). Bleaching dynamics in InAs self-assembled quantum dots. In Proceedings of the 27th International Conference on the Physics of Semiconductors (ICPS-27), 26-30 July 2005, Arizon Northern University, Flagstaff, Arizona, USA (pp. 731-732). (AIP Conference Proceedings; Vol. 772). Arizona, USA. https://doi.org/10.1063/1.1994314