Bit boundary testing coverage

N. Goga, F. Moldoveanu

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard
Original languageEnglish
Title of host publicationProceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005
PublisherInstitute of Electrical and Electronics Engineers
Pages408-411
ISBN (Print)0-7803-8886-0
DOIs
Publication statusPublished - 2005

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