Bit boundary testing coverage

N. Goga; F. Moldoveanu

doi:10.1109/CCECE.2005.1556958

Bit boundary testing coverage

N. Goga, F. Moldoveanu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard

Original language	English
Title of host publication	Proceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005
Publisher	Institute of Electrical and Electronics Engineers
Pages	408-411
ISBN (Print)	0-7803-8886-0
DOIs	https://doi.org/10.1109/CCECE.2005.1556958
Publication status	Published - 2005

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10.1109/CCECE.2005.1556958

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@inproceedings{368f557130064249aa3d8a86f3cd4957,

title = "Bit boundary testing coverage",

abstract = "In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard",

author = "N. Goga and F. Moldoveanu",

year = "2005",

doi = "10.1109/CCECE.2005.1556958",

language = "English",

isbn = "0-7803-8886-0",

pages = "408--411",

booktitle = "Proceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

Bit boundary testing coverage. / Goga, N.; Moldoveanu, F.
Proceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005. Institute of Electrical and Electronics Engineers, 2005. p. 408-411.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Goga, N.

AU - Moldoveanu, F.

PY - 2005

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N2 - In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard

AB - In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard

U2 - 10.1109/CCECE.2005.1556958

DO - 10.1109/CCECE.2005.1556958

M3 - Conference contribution

SN - 0-7803-8886-0

SP - 408

EP - 411

BT - Proceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005

PB - Institute of Electrical and Electronics Engineers

ER -

Bit boundary testing coverage

Abstract

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