Biquadratic interlayer exchange coupling in epitaxial Fe/Si/Fe

G.J. Strijkers, J.T. Kohlhepp, H.J.M. Swagten, W.J.M. de Jonge

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)
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We have studied the biquadratic exchange coupling in epitaxially grown Fe/Si/Fe. The temperature and thickness dependence of the biquadratic coupling strength were determined unambiguously by fitting the easy- and hard-axis magneto-optical Kerr effect loops. The origin of the biquadratic coupling can be fully understood in terms of Slonczewski's loose spins mechanism.

Original languageEnglish
Pages (from-to)5452-5454
Number of pages3
JournalJournal of Applied Physics
Issue number9
Publication statusPublished - 1 May 2000


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