Binary Nanoparticle Superlattices in 3D: from Quantitative Analysis of Crystal Structures to Characterization of Lattice Defects

Heiner Friedrich, Cedric J. Gommes, Karin Overgaag, utrecht university, Arie J. Verkleij, K.P. de Jong, Alfons van Blaaderen, Daniël A.M. Vanmaekelbergh

Research output: Contribution to journalConference articlepeer-review

Abstract

No abstract available
Original languageEnglish
Pages (from-to)1192-1193
Number of pages2
JournalMicroscopy and Microanalysis
Volume16
Issue numberS2
DOIs
Publication statusPublished - 26 Jul 2009

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