Bias-stress effect in organic field effect transistors

A. Sharma, S.G.J. Mathijssen, M. Kemerink, D.M. Leeuw, de, P.A. Bobbert

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Abstract

Abstract only.
Original languageEnglish
Title of host publicationPhysics@FOM Veldhoven, 19-20 January 2010, Veldhoven, The Netherlands
EditorsM. Graef, de, G. Zegers, E. Min, F. Pavert, van de
Place of PublicationUtrecht
PublisherStichting FOM
Pages170-
Publication statusPublished - 2010

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