Bias-stress effect in organic field effect transistors

A. Sharma; S.G.J. Mathijssen; M. Kemerink; D.M. Leeuw, de; P.A. Bobbert

Bias-stress effect in organic field effect transistors

A. Sharma, S.G.J. Mathijssen, M. Kemerink, D.M. Leeuw, de, P.A. Bobbert

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

2 Downloads (Pure)

Abstract

Abstract only.

Original language	English
Title of host publication	Physics@FOM Veldhoven, 19-20 January 2010, Veldhoven, The Netherlands
Editors	M. Graef, de, G. Zegers, E. Min, F. Pavert, van de
Place of Publication	Utrecht
Publisher	FOM: Stichting Fundamenteel onderzoek der Materie
Pages	170-
Publication status	Published - 2010

Cite this

@inproceedings{29118ed28cae48c68c2877cb7605d72a,

title = "Bias-stress effect in organic field effect transistors",

abstract = "Abstract only.",

author = "A. Sharma and S.G.J. Mathijssen and M. Kemerink and {Leeuw, de}, D.M. and P.A. Bobbert",

year = "2010",

language = "English",

pages = "170--",

editor = "{Graef, de}, M. and G. Zegers and E. Min and {Pavert, van de}, F.",

booktitle = "Physics@FOM Veldhoven, 19-20 January 2010, Veldhoven, The Netherlands",

publisher = "FOM: Stichting Fundamenteel onderzoek der Materie",

}

Bias-stress effect in organic field effect transistors. / Sharma, A.; Mathijssen, S.G.J.; Kemerink, M. et al.
Physics@FOM Veldhoven, 19-20 January 2010, Veldhoven, The Netherlands. ed. / M. Graef, de; G. Zegers; E. Min; F. Pavert, van de. Utrecht: FOM: Stichting Fundamenteel onderzoek der Materie, 2010. p. 170-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Bias-stress effect in organic field effect transistors

AU - Sharma, A.

AU - Mathijssen, S.G.J.

AU - Kemerink, M.

AU - Leeuw, de, D.M.

AU - Bobbert, P.A.

PY - 2010

Y1 - 2010

N2 - Abstract only.

AB - Abstract only.

M3 - Conference contribution

SP - 170-

BT - Physics@FOM Veldhoven, 19-20 January 2010, Veldhoven, The Netherlands

A2 - Graef, de, M.

A2 - Zegers, G.

A2 - Min, E.

A2 - Pavert, van de, F.

PB - FOM: Stichting Fundamenteel onderzoek der Materie

CY - Utrecht

ER -

Bias-stress effect in organic field effect transistors

Abstract

Fingerprint

Cite this