Bayesian-inference-based voltage dip state estimation

G. Ye, Y. Xiang, M. Nijhuis, V. Cuk, J.F.G. Cobben

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
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Abstract

Voltage dip state estimation (VDSE) tries to estimate the voltage dip characteristics at nonmonitored buses from measured voltage dip values at monitored buses. In this paper, the VDSE is addressed through the method based on Bayesian inference. A priori including the fault position among other grid conditions is used to estimate the residual voltage at each bus based on the measurement quantities, including their uncertainties. The dip duration is calculated with the time setting of protection system incorporating the uncertainties due to dip detection algorithm of the root mean square values. The proposed method has been applied to the IEEE 13-bus and IEEE 123-bus distribution test systems for multiple simulation scenarios, such as with or without distributed generation and different types of faults. The simulation results show good observability of the network.
Original languageEnglish
Article number8012429
Pages (from-to)2977-2987
Number of pages11
JournalIEEE Transactions on Instrumentation and Measurement
Volume66
Issue number11
DOIs
Publication statusPublished - 25 Oct 2017

Keywords

  • Bayesian inference
  • distribution system
  • estimation
  • power quality (PQ)
  • voltage dip

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