Barrier thickness dependence of the magnetoresistance in TaOx magnetic tunnel junctions

P.H.P. Koller, W.J.M. Jonge, de, R. Coehoorn

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A systematic study has been conducted on the dependence of the magnetoresistance (MR) ratio on the barrier thickness in TaOx-based magnetic tunnel junctions. The relatively low MR ratio (
Original languageEnglish
Article number083913
Pages (from-to)083913-1/4
Number of pages4
JournalJournal of Applied Physics
Issue number8
Publication statusPublished - 2005

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