Bandwidth analysis for reusing functional interconnect as test access mechanism

A. van den Berg, P. Ren, E.J. Marinissen, G.N. Gaydadjiev, K.G.W. Goossens

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)
89 Downloads (Pure)

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Engineering & Materials Science