AWG based wavelength-meter with pm resolution

D. D'Agostino, R.G. Broeke, M. Boerkamp, Jan Mink, H.P.M.M. Ambrosius, M.K. Smit

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Original languageEnglish
Title of host publicationProceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France
PagesTu 2b R2-1/2
Publication statusPublished - 2014

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