Automotive RF immunity test set-up analysis

M.J. Coenen; H. Pues; T. Bousquet

Automotive RF immunity test set-up analysis

M.J. Coenen
, H. Pues
, T. Bousquet

Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

Original language	English
Title of host publication	Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia
Editors	R. Gillon, G. Gielen, A. Baric
Place of Publication	Dubrovnik, Croatia
Publisher	Institute of Electrical and Electronics Engineers
Pages	71-75
ISBN (Print)	978-1-4577-0862-6
Publication status	Published - 2011
Event	8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia - Dubrovnik, Croatia Duration: 6 Nov 2011 → 9 Nov 2011

Workshop

Workshop	8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia
Abbreviated title	EMC Compo 2011
Country/Territory	Croatia
City	Dubrovnik
Period	6/11/11 → 9/11/11

Cite this

@inproceedings{d8534e289a4e4f51a0f9d4cfb2d656f3,

title = "Automotive RF immunity test set-up analysis",

abstract = "Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.",

author = "M.J. Coenen and H. Pues and T. Bousquet",

year = "2011",

language = "English",

isbn = "978-1-4577-0862-6",

pages = "71--75",

editor = "R. Gillon and G. Gielen and A. Baric",

booktitle = "Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia, EMC Compo 2011 ; Conference date: 06-11-2011 Through 09-11-2011",

}

Coenen, MJ, Pues, H & Bousquet, T 2011, Automotive RF immunity test set-up analysis. in R Gillon, G Gielen & A Baric (eds), Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia. Institute of Electrical and Electronics Engineers, Dubrovnik, Croatia, pp. 71-75, 8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia, Dubrovnik, Croatia, 6/11/11.

Automotive RF immunity test set-up analysis. / Coenen, M.J.; Pues, H.; Bousquet, T.
Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia. ed. / R. Gillon; G. Gielen; A. Baric. Dubrovnik, Croatia: Institute of Electrical and Electronics Engineers, 2011. p. 71-75.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Automotive RF immunity test set-up analysis

AU - Coenen, M.J.

AU - Pues, H.

AU - Bousquet, T.

PY - 2011

Y1 - 2011

N2 - Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

AB - Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

M3 - Conference contribution

SN - 978-1-4577-0862-6

SP - 71

EP - 75

BT - Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia

A2 - Gillon, R.

A2 - Gielen, G.

A2 - Baric, A.

PB - Institute of Electrical and Electronics Engineers

CY - Dubrovnik, Croatia

T2 - 8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia

Y2 - 6 November 2011 through 9 November 2011

ER -

Automotive RF immunity test set-up analysis

Abstract

Workshop

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