Abstract
Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
| Original language | English |
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| Title of host publication | Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 71-75 |
| ISBN (Print) | 978-1-4577-0862-6 |
| Publication status | Published - 2011 |
| Event | 8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia - Dubrovnik, Croatia Duration: 6 Nov 2011 → 9 Nov 2011 |
Workshop
| Workshop | 8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia |
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| Abbreviated title | EMC Compo 2011 |
| Country/Territory | Croatia |
| City | Dubrovnik |
| Period | 6/11/11 → 9/11/11 |