Abstract
Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and
unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, interlaboratory comparison as well as the search for design solutions and possible correlation with other measurement methods loses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together
with possible relation to the DPI and TEM cell methods used at the IC level.
Original language | English |
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Pages (from-to) | 16-25 |
Number of pages | 10 |
Journal | Interference Technology : the International Journal of Electromagnetic Compatibility |
Volume | 2011 |
Publication status | Published - 2011 |