Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, interlaboratory comparison as well as the search for design solutions and possible correlation with other measurement methods loses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
|Number of pages||10|
|Journal||Interference Technology : the International Journal of Electromagnetic Compatibility|
|Publication status||Published - 2011|