Automatic Scenario Detection for Improved WCET Estimation.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 42nd Design Automation Conference, DAC 2005
Place of Publication	New York
Publisher	Association for Computing Machinery, Inc.
Pages	101-104
ISBN (Print)	1-59593-133-3
Publication status	Published - 2005
Event	conference; DAC 2005, Anaheim, CA, USA; 2005-06-13; 2005-06-17 - Duration: 13 Jun 2005 → 17 Jun 2005

Conference	conference; DAC 2005, Anaheim, CA, USA; 2005-06-13; 2005-06-17
Period	13/06/05 → 17/06/05
Other	DAC 2005, Anaheim, CA, USA

Cite this

@inproceedings{3195327444854d09b46e831613854ccb,

title = "Automatic Scenario Detection for Improved WCET Estimation.",

author = "S.V. Gheorghita and S. Stuijk and T. Basten and H. Corporaal",

year = "2005",

language = "English",

isbn = "1-59593-133-3",

pages = "101--104",

booktitle = "Proceedings of the 42nd Design Automation Conference, DAC 2005",

publisher = "Association for Computing Machinery, Inc.",

address = "United States",

note = "conference; DAC 2005, Anaheim, CA, USA; 2005-06-13; 2005-06-17 ; Conference date: 13-06-2005 Through 17-06-2005",

}

TY - GEN

T1 - Automatic Scenario Detection for Improved WCET Estimation.

AU - Gheorghita, S.V.

AU - Stuijk, S.

AU - Basten, T.

AU - Corporaal, H.

PY - 2005

Y1 - 2005

M3 - Conference contribution

SN - 1-59593-133-3

SP - 101

EP - 104

BT - Proceedings of the 42nd Design Automation Conference, DAC 2005

PB - Association for Computing Machinery, Inc.

CY - New York

T2 - conference; DAC 2005, Anaheim, CA, USA; 2005-06-13; 2005-06-17

Y2 - 13 June 2005 through 17 June 2005

ER -