Automatic generation of in-circuit tests for board assembly defects

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Abstract

The components and the solder joints that are made during assembly to hold components to their printed circuit board can suffer from defects and therefore need to be tested. Many research papers on board-Assembly testing focus on boundary scan test, processor-controlled test, or other powered digital testing techniques that mostly ignore the indispensable passive circuits and that can incur damage that could have been avoided by executing a non-powered test first. In-circuit testing is a non-powered test method that applies stimuli and measures responses using probe needles. However, often used self-learning solutions for designing these tests need a known-good-board, entailing significant disadvantages. In this paper, a software tool is described that automatically generates in-circuit tests based on the product design files, without requiring probe access on every net. Furthermore, the tool indicates where on the board fault coverage is not maximal, and hence where extra probe access will improve the test quality.

Original languageEnglish
Title of host publicationProceedings - 2018 23rd IEEE European Test Symposium, ETS 2018
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Chapter8400714
Number of pages2
ISBN (Electronic)9781538637289
DOIs
Publication statusPublished - 29 May 2018
Event23rd IEEE European Test Symposium, ETS 2018 - Bremen, Germany
Duration: 28 May 20181 Jun 2018

Conference

Conference23rd IEEE European Test Symposium, ETS 2018
Country/TerritoryGermany
CityBremen
Period28/05/181/06/18

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