Abstract
The components and the solder joints that are made during assembly to hold components to their printed circuit board can suffer from defects and therefore need to be tested. Many research papers on board-Assembly testing focus on boundary scan test, processor-controlled test, or other powered digital testing techniques that mostly ignore the indispensable passive circuits and that can incur damage that could have been avoided by executing a non-powered test first. In-circuit testing is a non-powered test method that applies stimuli and measures responses using probe needles. However, often used self-learning solutions for designing these tests need a known-good-board, entailing significant disadvantages. In this paper, a software tool is described that automatically generates in-circuit tests based on the product design files, without requiring probe access on every net. Furthermore, the tool indicates where on the board fault coverage is not maximal, and hence where extra probe access will improve the test quality.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2018 23rd IEEE European Test Symposium, ETS 2018 |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Chapter | 8400714 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781538637289 |
| DOIs | |
| Publication status | Published - 29 May 2018 |
| Event | 23rd IEEE European Test Symposium, ETS 2018 - Bremen, Germany Duration: 28 May 2018 → 1 Jun 2018 |
Conference
| Conference | 23rd IEEE European Test Symposium, ETS 2018 |
|---|---|
| Country/Territory | Germany |
| City | Bremen |
| Period | 28/05/18 → 1/06/18 |
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Dive into the research topics of 'Automatic generation of in-circuit tests for board assembly defects'. Together they form a unique fingerprint.Research output
- 4 Citations - based on content available in repository [source: Scopus]
- 1 Conference contribution
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Automatic generation of in-circuit tests for board assembly defects
van Schaaijk, H., Spierings, M. & Marinissen, E. J., 15 Aug 2018, Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018. Institute of Electrical and Electronics Engineers, p. 13-18 6 p. 8462941Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile6 Link opens in a new tab Citations (Scopus)267 Downloads (Pure)
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