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Automatic Basis Function Selection in Iterative Learning Control: A Sparsity-Promoting Approach Applied to an Industrial Printer

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Abstract

Iterative learning control (ILC) techniques are capable of improving the tracking performance of control systems that repeatedly perform similar tasks by utilizing data from past iterations. The aim of this paper is to design a systematic approach for learning parameterized feedforward signals with limited complexity. The developed method involves an iterative learning control in conjunction with a data-driven sparse subset selection procedure for basis function selection. The ILC algorithm that employs sparse optimization is able to automatically select relevant basis functions and is validated on an industrial flatbed printer.

Original languageEnglish
Title of host publication2025 American Control Conference, ACC 2025
PublisherInstitute of Electrical and Electronics Engineers
Pages2931-2936
Number of pages6
ISBN (Electronic)979-8-3315-6937-2
DOIs
Publication statusPublished - 21 Aug 2025
Event2025 American Control Conference, ACC 2025 - Denver, United States
Duration: 8 Jul 202510 Jul 2025

Conference

Conference2025 American Control Conference, ACC 2025
Abbreviated titleACC 2025
Country/TerritoryUnited States
CityDenver
Period8/07/2510/07/25

Funding

This project is co-financed by Holland High Tech, top sector High-Tech Systems and Materials, with a PPP innovation subsidy for public-private partnerships for research and development. The authors gratefully acknowledge the contributions to this paper through a challenge-based learning project by Tim Aarts, Remco Bertels, Matthijs van Brunschot, Armando Cerullo, Yuri Copal, Hein van Dal, Roel Drenth, Hessel van Gemert, Bas Klis, Olaf van Lamsweerde, Gijs van Meerbeeck, Tom Minten, Gert Vankan, and Teun Wijfjes.

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