Abstract
Iterative learning control (ILC) techniques are capable of improving the tracking performance of control systems that repeatedly perform similar tasks by utilizing data from past iterations. The aim of this paper is to design a systematic approach for learning parameterized feedforward signals with limited complexity. The developed method involves an iterative learning control in conjunction with a data-driven sparse subset selection procedure for basis function selection. The ILC algorithm that employs sparse optimization is able to automatically select relevant basis functions and is validated on an industrial flatbed printer.
| Original language | English |
|---|---|
| Title of host publication | 2025 American Control Conference, ACC 2025 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 2931-2936 |
| Number of pages | 6 |
| ISBN (Electronic) | 979-8-3315-6937-2 |
| DOIs | |
| Publication status | Published - 21 Aug 2025 |
| Event | 2025 American Control Conference, ACC 2025 - Denver, United States Duration: 8 Jul 2025 → 10 Jul 2025 |
Conference
| Conference | 2025 American Control Conference, ACC 2025 |
|---|---|
| Abbreviated title | ACC 2025 |
| Country/Territory | United States |
| City | Denver |
| Period | 8/07/25 → 10/07/25 |
Funding
This project is co-financed by Holland High Tech, top sector High-Tech Systems and Materials, with a PPP innovation subsidy for public-private partnerships for research and development. The authors gratefully acknowledge the contributions to this paper through a challenge-based learning project by Tim Aarts, Remco Bertels, Matthijs van Brunschot, Armando Cerullo, Yuri Copal, Hein van Dal, Roel Drenth, Hessel van Gemert, Bas Klis, Olaf van Lamsweerde, Gijs van Meerbeeck, Tom Minten, Gert Vankan, and Teun Wijfjes.
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