Automated system for noise-measurements on low-ohmic samples and magnetic sensors

R.J.W. Jonker; J. Briaire; L.K.J. Vandamme

doi:10.1109/19.772210

Automated system for noise-measurements on low-ohmic samples and magnetic sensors

R.J.W. Jonker
, J. Briaire
, L.K.J. Vandamme

Research output: Contribution to journal › Article › Academic › peer-review

13 Citations (Scopus)

378 Downloads (Pure)

Abstract

An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis

Original language	English
Pages (from-to)	730-735
Number of pages	6
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	48
Issue number	3
DOIs	https://doi.org/10.1109/19.772210
Publication status	Published - 1999

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title = "Automated system for noise-measurements on low-ohmic samples and magnetic sensors",

abstract = "An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis",

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AU - Jonker, R.J.W.

AU - Briaire, J.

AU - Vandamme, L.K.J.

PY - 1999

Y1 - 1999

N2 - An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis

AB - An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis

U2 - 10.1109/19.772210

DO - 10.1109/19.772210

M3 - Article

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VL - 48

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EP - 735

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 3

ER -

Automated system for noise-measurements on low-ohmic samples and magnetic sensors

Abstract

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